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Last Updated： Aggregation Period:Jun 03, 2026～Jun 30, 2026
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Structural Analysis Product List

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Structural analysis of prismatic Li-ion batteries.

Structural analysis of prismatic Li-ion batteries.

Observation using optical microscopy and ultra-low acceleration FE-SEM! Detailed structural analysis and elemental analysis are possible.

By mechanically polishing commercially available rectangular Li-ion batteries and observing them with optical microscopy and ultra-low acceleration FE-SEM, detailed structural analysis and elemental analysis can be performed. The materials introduce the overall structure of the Li-ion battery and detailed structural observations of the Li-ion battery using SEM and ultra-low acceleration FE-SEM through photographs. [Analysis Overview] ■ Overall structure of the Li-ion battery and SEM observation ■ Detailed structural observation of the Li-ion battery using ultra-low acceleration FE-SEM *For more details, please refer to the PDF materials or feel free to contact us.

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  • Analysis Services
  • Other contract services
  • Structural Analysis

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Structural analysis of nanomaterials

Structural analysis of nanomaterials

We offer contract services for structural analysis and morphological observation at the nanoscale.

We offer contract services for structural analysis and morphological observation of nanomaterials such as nanotubes using TEM, SEM, and EDS in the nanoscale region.

  • Contract measurement
  • Structural Analysis

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Technical Information Magazine 201904-02 Cellulose Nanofiber Structural Analysis

Technical Information Magazine 201904-02 Cellulose Nanofiber Structural Analysis

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In the research and development of CNF, the use of electron microscopy for observation has become a necessary evaluation across almost all material fields and research phases. Particularly for observing CNF dispersed in polymers using TEM, it is essential to employ the technique of "electron staining," which has been crucial for preparing TEM samples of polymer materials. In this presentation, we will introduce examples of morphological observations of composite materials using CNF, as well as observation cases of the CNF itself, structural analysis examples such as crystallinity measured by 13C solid-state NMR, and examples of compositional sugar analysis using acid hydrolysis HPLC-fluorescence detection. **Table of Contents** 1. Introduction 2. Overview of Morphological Observation 3. Observation Cases of CNF and CNF/Polymer 4. Evaluation of CNF Crystallinity 5. Compositional Sugar Analysis of CNF (HPLC-Fluorescence Detection) 6. Conclusion

  • Contract Analysis
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  • Technical and Reference Books
  • Structural Analysis

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Technical Information Magazine 202001-02 Crystal Structure Analysis of Gallium Oxide

Technical Information Magazine 202001-02 Crystal Structure Analysis of Gallium Oxide

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** Gallium oxide (Ga2O3) is attracting attention as a next-generation power semiconductor material, and research has been actively conducted in recent years. Optimizing process technology is essential for improving the reliability and characteristics of semiconductor devices, making the evaluation methods crucial. This paper presents examples of crystal structure analysis necessary for assessing the quality of epitaxial films, as well as the analysis of impurities, defects, and carrier concentration in the ion implantation process, which significantly impacts device characteristics. **Table of Contents** 1. Introduction 2. Crystal structure analysis using cross-sectional TEM and planar STEM 3. Evaluation of the ion implantation process 4. Conclusion

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  • Technical and Reference Books
  • Structural Analysis

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Technical Information Magazine 201901-02 Nanometer Scale Local Structure Analysis

Technical Information Magazine 201901-02 Nanometer Scale Local Structure Analysis

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** Spectroscopic analysis techniques utilizing near-field light localized at the tips of metal chips are highly anticipated methods for analyzing chemical structures in the nanometer range. Techniques such as tip-enhanced Raman spectroscopy and near-field Raman spectroscopy are representative methods, and various studies have been conducted on their principles and applications. This paper presents examples of their application in material analysis and discusses their practicality for material characterization. **Table of Contents** 1. Introduction 2. Crystal structure analysis of CNTs using TERS 3. Stress analysis at the SiO2/SiC interface using SNOM-Raman 4. Conclusion

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  • Technical and Reference Books
  • Structural Analysis

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[Structural Analysis Example] Coupled Problem 2 Using Particle Method (SPH)

[Structural Analysis Example] Coupled Problem 2 Using Particle Method (SPH)

The aircraft is composed of shell elements with actual collision intensity equivalent! Introducing examples in aviation.

We will introduce the analysis of aircraft water landing behavior. The airplane is composed of shell elements that have equivalent impact strength. The number of nodes is 143,242, and the number of elements is 144,223 (Shells 8,691, SPH 135,542). In the related links below, we present the analysis results in images, so please take a look. 【Case Overview】 ■ Water is represented by SPH elements ■ The airplane is composed of shell elements that have equivalent impact strength ■ Number of nodes: 143,242 Number of elements: 144,223 (Shells 8,691, SPH 135,542) ■ Analysis time: 4.0 seconds Computation time: 34 hours 22 minutes ■ PC CPU: Core 2 Duo 64 bits×2 3.33GHz used *For more details, please refer to the related links or feel free to contact us.

  • Structural Analysis
  • Structural Analysis

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[Use Case] Structural Analysis

[Use Case] Structural Analysis

It is a field of engineering that deals with the behavior of structures subjected to dynamic loads (vibrations).

Structural analysis is a field of engineering that deals with the behavior of structures subjected to dynamic loads (vibrations). While it is possible to accurately predict the behavior of structures under static loads, dynamic loads require parameters that are difficult to model, such as structural damping. Therefore, to accurately determine the response of structures to dynamic loads, it is necessary to conduct some form of structural analysis test, such as a modal test. Modal testing allows for the experimental determination of the modal parameters of a structure. Modal parameters include resonance frequency, damping, and mode shapes. The resonance frequency is the frequency at which the response is amplified significantly beyond the applied excitation force. When the excitation force is close to the structure's resonance frequency, it often leads to adverse effects, making it important to know the resonance frequency. Excessive vibrations caused by resonance can lead to fatigue failure, damage to delicate parts of the structure, and in extreme cases, structural collapse. For more details, please contact us.

  • Other network tools
  • Other information systems
  • Structural Analysis

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Business Information: Process Analysis

Business Information: Process Analysis

Research on key innovative process technologies, optimization of manufacturing costs, and improvement of yield!

The process helps determine the cost, quality, and performance of devices, and often compensates for design flaws. TechInsights employs 10 process experts and provides the collective expertise accumulated over more than 140 years in device structure analysis. Devices include but are not limited to CMOS, bipolar, BiCMOS, GaAs, SiGe, copper, low-k dielectrics, SOI, strained silicon, MEMS, and TFT. Using data collected through TechInsights' specialized technology, we provide information on the structure, material composition, critical dimensions, and manufacturing processes of your products or competing products in the form of process analysis reports. 【Example Issues Addressed】 - How to embed memory (flash, DRAM, SRAM, FeRAM) into logic devices - How to mitigate risks when transitioning to more advanced process generations - What transistor performance major competing products have - How RF devices are integrated into CMOS For more details, please contact us or download the catalog.

  • Patents
  • Structural Analysis

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Panasonic ReRAM 8-bit microcontroller structural analysis

Panasonic ReRAM 8-bit microcontroller structural analysis

Panasonic ReRAM-equipped MN101LR05D 8-bit microcontroller

The MN101LR05D is a low-power 8-bit single-chip microcontroller developed for portable healthcare, security devices, and sensor processing. The MN101LR05D features a CPU core with a 10MHz 8-bit AM13L, 64KB of ReRAM capacity, and 4KB of SRAM capacity. The MR101LR05D is the world's first mass-produced practical example of ReRAM (Resistive RAM), and it is expected to be widely utilized as a successor technology to existing non-volatile memory. The MN101LR05D is manufactured using a 180nm CMOS process with four layers of AI metallization. The ReRAM cell of this metal oxide is formed between stack W vias connecting metal 3 to metal 4. The results of the report are based on data from scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy-dispersive X-ray analysis (TEM-EDS), electron energy loss spectroscopy (TEM-EEKS), and spreading resistance measurement (SRP).

  • Other electronic parts
  • Structural Analysis

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